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ABSTRACT Strain plays a critical role in the properties of materials. In silicon and silicon–germanium, strain provides a mechanism for control of both carrier mobility and band offsets. In
materials integration, strain is typically tuned through the use of dislocations and elemental composition. We demonstrate a versatile method to control strain by fabricating membranes in
which the final strain state is controlled by elastic strain sharing, that is, without the formation of defects. We grow Si/SiGe layers on a substrate from which they can be released,
forming nanomembranes. X-ray-diffraction measurements confirm a final strain predicted by elasticity theory. The effectiveness of elastic strain to alter electronic properties is
demonstrated by low-temperature longitudinal Hall-effect measurements on a strained-silicon quantum well before and after release. Elastic strain sharing and film transfer offer an
intriguing path towards complex, multiple-layer structures in which each layer’s properties are controlled elastically, without the introduction of undesirable defects. Access through your
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BEING VIEWED BY OTHERS SUPPRESSED THERMAL TRANSPORT IN SILICON NANORIBBONS BY INHOMOGENEOUS STRAIN Article 15 May 2024 STRAIN-INDUCED ROOM-TEMPERATURE FERROELECTRICITY IN SRTIO3 MEMBRANES
Article Open access 19 June 2020 FULL INTEGRATION OF HIGHLY STRETCHABLE INORGANIC TRANSISTORS AND CIRCUITS WITHIN MOLECULAR-TAILORED ELASTIC SUBSTRATES ON A LARGE SCALE Article Open access
01 April 2024 REFERENCES * Ieong, M., Doris, B., Kedzierski, J., Rim, K. & Yang, M. Silicon device scaling to the sub-10-nm regime. _Science_ 306, 2057–2060 (2004). Article Google
Scholar * Rim, K., Hoyt, J. L. & Gibbons, J. F. Fabrication and analysis of deep submicron strained-Si N-MOSFET’s. _IEEE Trans. Electron Devices_ 47, 1406–1415 (2000). Article Google
Scholar * Mooney, P. M. & Chu, J. O. Heteroepitaxy and high-speed microelectronics. _Annu. Rev. Mater. Sci._ 30, 335–362 (2000). Article Google Scholar * Fitzgerald, E. A. et al.
Relaxed GexSi1−x structures for III-V integration with Si and high mobility two-dimensional electron gases in Si. _J. Vac. Sci. Technol. B_ 10, 1807–1819 (1992). Article Google Scholar *
Ismail, K. et al. Identification of a mobility-limiting scattering mechanism iin modulation-doped Si/SiGe heterostructures. _Phys. Rev. Lett._ 73, 3447–3450 (1994). Article Google Scholar
* Monroe, D., Xie, Y. H., Fitzgerald, E. A., Silverman, P. J. & Watson, G. P. Comparison of mobility-limiting mechanisms in high-mobility Si1−xGex heterostructures. _J. Vac. Sci.
Technol. B_ 11, 1731–1737 (1993). Article Google Scholar * Lo, Y. H. New approach to grow pseudomorphic structures over the critical thickness. _Appl. Phys. Lett._ 59, 2311–2313 (1991).
Article Google Scholar * Brown, A. S. Compliant substrate technology: Status and prospects. _J. Vac. Sci. Technol. B_ 16, 2308–2312 (1998). Article Google Scholar * Hobart, K. D. et al.
Compliant substrates: A comparative study of the relaxation mechanisms of strained films bonded to high and low viscosity oxides. _J. Electron. Mater._ 29, 897–900 (2000). Article Google
Scholar * Yin, H. et al. Buckling suppression of SiGe islands on compliant substrates. _J. Appl. Phys._ 94, 6875–6882 (2003). Article Google Scholar * Ejeckam, F. E., Lo, Y. H.,
Subramanian, S., Hou, H. Q. & Hammons, B. E. Lattice engineered compliant substrate for defect-free heteroepitaxial growth. _Appl. Phys. Lett._ 70, 1685–1687 (1997). Article Google
Scholar * Mooney, P. M., Cohen, G. M., Chu, J. O. & Murray, C. E. Elastic strain relaxation in free-standing SiGe/Si structures. _Appl. Phys. Lett._ 84, 1093–1095 (2004). Article
Google Scholar * Jones, A. M. et al. Long-wavelength InGaAs quantum wells grown without strain-induced warping on InGaAs compliant membranes above a GaAs substrate. _Appl. Phys. Lett._ 74,
1000–1002 (1999). Article Google Scholar * Cohen, G. M., Mooney, P. M., Paruchuri, V. K. & Hovel, H. J. Dislocation-free strained silicon-on-silicon by in-place bonding. _Appl. Phys.
Lett._ 86, 251902 (2005). Article Google Scholar * Damlencourt, J.-F. et al. Paramorphic growth: A new approach in mismatched heteroepitaxy to prepare fuly relaxed materials. _Jpn J. Appl.
Phys._ 38, L996–L999 (1999). Article Google Scholar * Boudaa, M. et al. Growth and characterization of totally relaxed InGaAs thick layers on strain-relaxed paramorphic InP substrates.
_J. Electron. Mater._ 33, 833–839 (2004). Article Google Scholar * Demeester, P., Pollentier, I., De Dobbelaere, P., Brys, C. & Van Daele, P. Epitaxial lift-off and its applications.
_Semicond. Sci. Technol._ 8, 1124–1135 (1993). Article Google Scholar * Menard, E., Lee, K. J., Khang, D.-Y., Nuzzo, R. G. & Rogers, J. A. A printable form of silicon for high
performance thin film transistors plastic substrates. _Appl. Phys. Lett._ 84, 5398–5400 (2004). Article Google Scholar * Yablonovitch, E., Hwang, D. M., Gmitter, T. J., Forez, L. T. &
Harbison, J. P. Van der Waals bonding of GaAs epitaxial liftoff films onto arbitrary substrates. _Appl. Phys. Lett._ 56, 2419–2421 (1990). Article Google Scholar * Langdo, T. A. et al.
SiGe-free strained Si on insulator by wafer bonding and layer transfer. _Appl. Phys. Lett._ 82, 4256–4258 (2003). Article Google Scholar * Moriceau, H. et al. New layer transfers obtained
by the SmartCut process. _J. Electron. Mater._ 32, 829–835 (2003). Article Google Scholar * Freund, L. B. & Suresh, S. _Thin Film Materials_ (Cambridge Univ. Press, Cambridge, 2003).
Google Scholar * van Houten, H., Williamson, J. G., Broekaart, M. E. I., Foxon, C. T. & Harris, J. J. Magnetoresistance in a GaAs/AlxGa1−xAs heterostructure with double subband
occupancy. _Phys. Rev. B_ 37, 2756–2758 (1988). Article Google Scholar * Beenakker, C. W. J. & van Houten, H. Quantum transport in semiconductor nanosturctures. _Solid State Phys._ 44,
1 (1991). Article Google Scholar * Schäffler, F. High-mobility Si and Ge structures. _Semicond. Sci. Technol._ 12, 1515–1549 (1997). Article Google Scholar Download references
ACKNOWLEDGEMENTS This research was supported by DOE, NSF-MRSEC, AFOSR, NSF-ITR, ARDA, ARO and NSA. AUTHOR INFORMATION AUTHORS AND AFFILIATIONS * University of Wisconsin–Madison, Madison,
Wisconsin, 53711, USA Michelle M. Roberts, Levente J. Klein, Donald E. Savage, Keith A. Slinker, Mark Friesen, Mark A. Eriksson & Max G. Lagally * Soitec USA, 2 Centennial Drive,
Peabody, Massachusetts, 01960, USA George Celler Authors * Michelle M. Roberts View author publications You can also search for this author inPubMed Google Scholar * Levente J. Klein View
author publications You can also search for this author inPubMed Google Scholar * Donald E. Savage View author publications You can also search for this author inPubMed Google Scholar *
Keith A. Slinker View author publications You can also search for this author inPubMed Google Scholar * Mark Friesen View author publications You can also search for this author inPubMed
Google Scholar * George Celler View author publications You can also search for this author inPubMed Google Scholar * Mark A. Eriksson View author publications You can also search for this
author inPubMed Google Scholar * Max G. Lagally View author publications You can also search for this author inPubMed Google Scholar CORRESPONDING AUTHOR Correspondence to Mark A. Eriksson.
ETHICS DECLARATIONS COMPETING INTERESTS Three of the authors, M. M. Roberts, D. E. Savage and M. G. Lagally, are listed as inventors on U.S. Patent application #P04286US, "Fabrication
of Silicon-Germanium Heterojunction Structures", filed December 16, 2004. G. Celler is employed by Soitec, a maker of silicon-on-insulator. RIGHTS AND PERMISSIONS Reprints and
permissions ABOUT THIS ARTICLE CITE THIS ARTICLE Roberts, M., Klein, L., Savage, D. _et al._ Elastically relaxed free-standing strained-silicon nanomembranes. _Nature Mater_ 5, 388–393
(2006). https://doi.org/10.1038/nmat1606 Download citation * Received: 08 August 2005 * Accepted: 25 January 2006 * Published: 09 April 2006 * Issue Date: 01 May 2006 * DOI:
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